Keysight launches a new parallel parameter test system to help implement cost-effective high-throughput wafer testing

December 6, 2021, Beijing, China – Keysight Technologies (NYSE: KEYS) recently announced the launch of a new Keysight P9002A parallel parameter test system. The system can achieve high-throughput, cost-effective wafer testing, thereby accelerating product launch and reducing manufacturing test costs. Keysight provides advanced design and verification solutions aimed at accelerating innovation and creating a secure and interconnected world.

At present, the shortage of global semiconductor supply has led to an increasing demand for semiconductors, especially in the automotive industry, digital equipment and household appliances industries. Although semiconductor technology innovation is progressing rapidly, the industry has encountered a series of technical challenges in adapting to new materials, reducing dimensions and 3D packaging processes. In addition, various complex devices designed for commercial applications such as 5G, data centers, artificial intelligence (AI), and automobiles have also led to unabated test parameters.

In order to meet this challenge and enable manufacturers to rapidly increase production capacity, Keysight has launched a new P9002A parallel parameter test system. The system can achieve high throughput, cost-effective wafer testing. It uses a flexible option structure that can be used for up to 100 channels of parallel test resources, and has the ability to perform parameter tests on each test resource. The software run by Keysight’s P9000 series is compatible with SPECS software, which runs on the 4080 series parameter test system, so customers can make full use of existing test procedures and test plans with data correlation.

Keysight’s new P9002A parallel parameter test system has the following key advantages:

ŸAble to add options according to test requirements, and adopt a license structure that is conducive to cost control.

Ÿ Compared with the 4080 series parameter test system, the unique parameter test technology and fast capacitance measurement can significantly improve the test throughput.

ŸIt can be compatible with Keysight 4080 series parameter test system and associated data, so that customers can make full use of their existing test system procedures, test plans, probe cards and probe card adapters compatible with 4080 test systems, thereby minimizing the establishment of new P9002A tests The cost of the environment.

Shinji Terasawa, Keysight’s Vice President and General Manager of Wafer Test Solutions, said: “Keysight is very pleased to support the ever-changing semiconductor R&D and manufacturing through advanced measurement solutions such as the P9002A test system. Keysight is committed to using us. Mature experience and professional knowledge in parameter testing help customers

The Links:   MCC56-14IO1B CM1000HA-24E

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